An effective two-pattern test generator for Arithmetic BIST
نویسندگان
چکیده
Article history: Received 29 June 2010 Received in revised form 18 October 2012 Accepted 18 October 2012 Available online 20 November 2012 0045-7906/$ see front matter 2012 Elsevier Ltd http://dx.doi.org/10.1016/j.compeleceng.2012.10.00 q Reviews processed and approved for publication ⇑ Corresponding author. Tel.: +3
منابع مشابه
VHDL Implementation of ALU with Built In Self Test Technique
In today’s Integrated Circuits (ICs), Built-In-Self Test (BIST) is becoming increasingly important as designs become more complicated. BIST is a design technique that allows a circuit to test itself Test pattern generator (TPG) using Linear Feedback Shift Resister (LFSR) is proposed which is more suitable for BIST architecture.In this paper we have design ALU (arithmetic and logic unit) in VHDL...
متن کاملAn Effective BIST TPG for Variable Precision Floating Point Multiplier
The accuracy of the multiplication depends on the precision of the multiplier. The variable precision floating point multiplier will have more accuracy when compared with the fixed precision multiplier. In this paper a variable precision floating point multiplier is considered. An effective BIST test pattern generator for variable precision floating point multiplier is proposed. A BIST TPG cons...
متن کاملPerformance of Generic and Recursive Pseudo Exhaustive Two-Pattern Generator
The main objective of this research is to design a Built-in self-test (BIST) technique based on pseudo-exhaustive testing. Two pattern test generator is used to provide high fault coverage. To provides fault coverage of detectable combinational faults with minimum number of test patterns than the conventional exhaustive test pattern generation, increases the speed of BIST and may posses minimum...
متن کاملColumn-matching based mixed-mode test pattern generator design technique for BIST
A novel test-per-clock built-in self-test (BIST) equipment design method for combinational or full-scan sequential circuits is proposed in this paper. Particularly, the test pattern generator is being designed. The method is based on similar principles as are well known test pattern generator design methods, like bit-fixing and bit-flipping. The novelty comprises in proposing a brand new algori...
متن کاملAutomated Synthesis of Configurable Two-dimensional Linear Feedback Shifter Registers for Random/Embedded Test Patterns
Abstract A new approach to optimize a configurable twodimensional (2-D) linear feedback shift registers (LFSR) for both embedded and random test pattern generation in built-in self-test (BIST) is proposed. This configurable 2-D LFSR based test pattern generator generates: 1) a deterministic sequence of test patterns for random-pattern-resistant faults, and then 2) random patterns for random-pat...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید
ثبت ناماگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید
ورودعنوان ژورنال:
- Computers & Electrical Engineering
دوره 39 شماره
صفحات -
تاریخ انتشار 2013